Embedded mechatronic systems : analysis of failures, predictive reliability. Volume 1 / edited by Abdelkhalak El Hami and Philippe Pougnet.

Includes bibliographical references and index.

Reliability-based design optimization -- Non-destructive characterization by spectroscopic ellipsometry of interfaces in mechatronic devices -- Method of characterizing the electromagnetic environment in hyperfrequency circuits encapsulated within metallic cavities -- Metrology of static and dynamic displacements and deformations using full-field techniques -- Characterization of switching transistors under electrical overvoltage stresses -- Reliability of radio frequency power transistors to electromagnetic and thermal stress -- Internal temperature measurement of electronic components -- Reliability prediction of embedded electronic systems: the FIDES guide - -Study of the dynamic contact between deformable solids.